{"data":{"id":"us/40-cfr-63.7181","jurisdiction":"us","citation":"40 CFR 63.7181","heading":"Am I subject to this subpart?","body":"(a) You are subject to this subpart if you own or operate a semiconductor manufacturing process unit that is a major source of hazardous air pollutants (HAP) emissions or that is located at, or is part of, a major source of HAP emissions.\n(b) A major source of HAP emissions is any stationary source or group of stationary sources located within a contiguous area and under common control that emits or has the potential to emit, considering controls, in the aggregate, any single HAP at a rate of 10 tons per year (tpy) or more or any combination of HAP at a rate of 25 tpy or more.","path":["Title 40—Protection of Environment","CHAPTER I—ENVIRONMENTAL PROTECTION AGENCY","SUBCHAPTER C—AIR PROGRAMS","PART 63—NATIONAL EMISSION STANDARDS FOR HAZARDOUS AIR POLLUTANTS FOR SOURCE CATEGORIES","Subpart BBBBB—National Emission Standards for Hazardous Air Pollutants for Semiconductor Manufacturing"],"source_url":"https://www.ecfr.gov/api/versioner/v1/full/2026-08-25/title-40.xml","current_through":"2026-08-25","vintage":"","retrieved_at":"2026-08-27T02:26:04Z","sha256":"5645c83fb3915bb597dff60661f6a714e9e58a1c53af6f1f0ca4b817ee6a7cbc","source_id":"us-cfr","stale":true,"prev":"us/40-cfr-63.7180","next":"us/40-cfr-63.7182"},"notice":"GroundRules: Original legal text. Not legal advice."}