{"data":{"id":"us/40-cfr-table-i-17-to-subpart-i-of-part-98","jurisdiction":"us","citation":"40 CFR Table I-17 to Subpart I of Part 98","heading":"Table I-17 to Subpart I of Part 98—Expected and Possible By-Products for Electronics Manufacturing","body":"For each stack system for which you use the “stack test method” to calculate annual emissions, you must measure the following: If emissions are detected intermittently, use the following procedures: If emissions are not detected, use the following procedures:\nExpected By-products: CF4 C2 F6 CHF3 CH2 F2 CH3 F Use the measured concentration for “Xksm” in Equation I-18 when available and use one-half of the field detection limit you determined for the fluorinated GHG according to § 98.94(j)(2) for the value of “Xksm” when the fluorinated GHG is not detected Use one-half of the field detection limit you determined for the fluorinated GHG according to § 98.94(j)(2) for the value of “Xksm” in Equation I-18.\nPossible By-products: C3 F8 C4 F6 c-C4 F8 C5 F8 Use the measured concentration for “Xksm” in Equation I-18 when available and use one-half of the field detection limit you determined for the fluorinated GHG according to § 98.94(j)(2) for the value of “Xksm” when the fluorinated GHG is not detected Assume zero emissions for that fluorinated GHG for the tested stack system.","path":["Title 40—Protection of Environment","CHAPTER I—ENVIRONMENTAL PROTECTION AGENCY","SUBCHAPTER C—AIR PROGRAMS","PART 98—MANDATORY GREENHOUSE GAS REPORTING","Subpart I—Electronics Manufacturing"],"source_url":"https://www.ecfr.gov/api/versioner/v1/full/2026-08-25/title-40.xml","current_through":"2026-08-25","vintage":"","retrieved_at":"2026-08-27T02:26:04Z","sha256":"c5b6a7449d86f00b38b259ab61f8250bd101a86de6d8b835373310f1cafba8d8","source_id":"us-cfr","stale":true,"prev":"us/40-cfr-table-i-16-to-subpart-i-of-part-98","next":"us/40-cfr-table-i-18-to-subpart-i-of-part-98"},"notice":"GroundRules: Original legal text. Not legal advice."}