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- 40 CFR 97.1028 · Administrator's action on submissions.
- 40 CFR 97.1029 · [Reserved]
- 40 CFR 97.1030 · General monitoring, recordkeeping, and reporting requirements.
- 40 CFR 97.1031 · Initial monitoring system certification and recertification procedures.
- 40 CFR 97.1032 · Monitoring system out-of-control periods.
- 40 CFR 97.1033 · Notifications concerning monitoring.
- 40 CFR 97.1034 · Recordkeeping and reporting.
- 40 CFR 97.1035 · Petitions for alternatives to monitoring, recordkeeping, or reporting requirements.
- 40 CFR 98.1 · Purpose and scope.
- 40 CFR 98.2 · Who must report?
- 40 CFR 98.3 · What are the general monitoring, reporting, recordkeeping and verification requirements of this part?
- 40 CFR 98.4 · Authorization and responsibilities of the designated representative.
- 40 CFR 98.5 · How is the report submitted?
- 40 CFR 98.6 · Definitions.
- 40 CFR 98.7 · What standardized methods are incorporated by reference into this part?
- 40 CFR 98.8 · What are the compliance and enforcement provisions of this part?
- 40 CFR 98.9 · Addresses.
- 40 CFR Table A-1 to Subpart A of Part 98 · Table A-1 to Subpart A of Part 98—Global Warming Potentials, 100-Year Time Horizon
- 40 CFR Table A-2 to Subpart A of Part 98 · Table A-2 to Subpart A of Part 98—Units of Measure Conversions
- 40 CFR Table A-3 to Subpart A of Part 98 · Table A-3 to Subpart A of Part 98—Source Category List for § 98.2(a)(1)
- 40 CFR Table A-4 to Subpart A of Part 98 · Table A-4 to Subpart A of Part 98—Source Category List for § 98.2(a)(2)
- 40 CFR Table A-5 to Subpart A of Part 98 · Table A-5 to Subpart A of Part 98—Supplier Category List for § 98.2(a)(4)
- 40 CFR Table A-6 to Subpart A of Part 98 · Table A-6 to Subpart A of Part 98—Data Elements That Are Inputs to Emission Equations and for Which the Reporting Deadline Is March 31, 2013
- 40 CFR Table A-7 to Subpart A of Part 98 · Table A-7 to Subpart A of Part 98—Data Elements That Are Inputs to Emission Equations and for Which the Reporting Deadline Is March 31, 2015
- 40 CFR 98.30 · Definition of the source category.
- 40 CFR 98.31 · Reporting threshold.
- 40 CFR 98.32 · GHGs to report.
- 40 CFR 98.33 · Calculating GHG emissions.
- 40 CFR 98.34 · Monitoring and QA/QC requirements.
- 40 CFR 98.35 · Procedures for estimating missing data.
- 40 CFR 98.36 · Data reporting requirements.
- 40 CFR 98.37 · Records that must be retained.
- 40 CFR 98.38 · Definitions.
- 40 CFR Table C-1 to Subpart C of Part 98 · Table C-1 to Subpart C of Part 98—Default CO2 Emission Factors and High Heat Values for Various Types of Fuel
- 40 CFR Table C-2 to Subpart C of Part 98 · Table C-2 to Subpart C of Part 98—Default CH4 and N2O Emission Factors for Various Types of Fuel
- 40 CFR 98.40 · Definition of the source category.
- 40 CFR 98.41 · Reporting threshold.
- 40 CFR 98.42 · GHGs to report.
- 40 CFR 98.43 · Calculating GHG emissions.
- 40 CFR 98.44 · Monitoring and QA/QC requirements.
- 40 CFR 98.45 · Procedures for estimating missing data.
- 40 CFR 98.46 · Data reporting requirements.
- 40 CFR 98.47 · Records that must be retained.
- 40 CFR 98.48 · Definitions.
- 40 CFR 98.50 · Definition of source category.
- 40 CFR 98.51 · Reporting threshold.
- 40 CFR 98.52 · GHGs to report.
- 40 CFR 98.53 · Calculating GHG emissions.
- 40 CFR 98.54 · Monitoring and QA/QC requirements.
- 40 CFR 98.55 · Procedures for estimating missing data.
- 40 CFR 98.56 · Data reporting requirements.
- 40 CFR 98.57 · Records that must be retained.
- 40 CFR 98.58 · Definitions.
- 40 CFR 98.60 · Definition of the source category.
- 40 CFR 98.61 · Reporting threshold.
- 40 CFR 98.62 · GHGs to report.
- 40 CFR 98.63 · Calculating GHG emissions.
- 40 CFR 98.64 · Monitoring and QA/QC requirements.
- 40 CFR 98.65 · Procedures for estimating missing data.
- 40 CFR 98.66 · Data reporting requirements.
- 40 CFR 98.67 · Records that must be retained.
- 40 CFR 98.68 · Definitions.
- 40 CFR Table F-1 to Subpart F of Part 98 · Table F-1 to Subpart F of Part 98—Slope and Overvoltage Coefficients for the Calculation of PFC Emissions From Aluminum Production
- 40 CFR Table F-2 to Subpart F of Part 98 · Table F-2 to Subpart F of Part 98—Default Data Sources for Parameters Used for CO2 Emissions
- 40 CFR 98.70 · Definition of source category.
- 40 CFR 98.71 · Reporting threshold.
- 40 CFR 98.72 · GHGs to report.
- 40 CFR 98.73 · Calculating GHG emissions.
- 40 CFR 98.74 · Monitoring and QA/QC requirements.
- 40 CFR 98.75 · Procedures for estimating missing data.
- 40 CFR 98.76 · Data reporting requirements.
- 40 CFR 98.77 · Records that must be retained.
- 40 CFR 98.78 · Definitions.
- 40 CFR 98.80 · Definition of the source category.
- 40 CFR 98.81 · Reporting threshold.
- 40 CFR 98.82 · GHGs to report.
- 40 CFR 98.83 · Calculating GHG emissions.
- 40 CFR 98.84 · Monitoring and QA/QC requirements.
- 40 CFR 98.85 · Procedures for estimating missing data.
- 40 CFR 98.86 · Data reporting requirements.
- 40 CFR 98.87 · Records that must be retained.
- 40 CFR 98.88 · Definitions.
- 40 CFR 98.90 · Definition of the source category.
- 40 CFR 98.91 · Reporting threshold.
- 40 CFR 98.92 · GHGs to report.
- 40 CFR 98.93 · Calculating GHG emissions.
- 40 CFR 98.94 · Monitoring and QA/QC requirements.
- 40 CFR 98.95 · Procedures for estimating missing data.
- 40 CFR 98.96 · Data reporting requirements.
- 40 CFR 98.97 · Records that must be retained.
- 40 CFR 98.98 · Definitions.
- 40 CFR Table I-1 to Subpart I of Part 98 · Table I-1 to Subpart I of Part 98—Default Emission Factors for Manufacturing Capacity-Based Threshold Applicability Determination
- 40 CFR Table I-2 to Subpart I of Part 98 · Table I-2 to Subpart I of Part 98—Default Emission Factors for Gas Consumption-Based Threshold Applicability Determination
- 40 CFR Table I-3 to Subpart I of Part 98 · Table I-3 to Subpart I of Part 98—Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for Semiconductor Manufacturing for 150 mm and 200 mm Wafer Sizes
- 40 CFR Table I-4 to Subpart I of Part 98 · Table I-4 to Subpart I of Part 98— Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for Semiconductor Manufacturing for 300 mm and 450 mm Wafer Size
- 40 CFR Table I-5 to Subpart I of Part 98 · Table I-5 to Subpart I of Part 98—Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for MEMS Manufacturing
- 40 CFR Table I-6 to Subpart I of Part 98 · Table I-6 to Subpart I of Part 98—Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for LCD Manufacturing
- 40 CFR Table I-7 to Subpart I of Part 98 · Table I-7 To Subpart I of Part 98—Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for PV Manufacturing
- 40 CFR Table I-8 to Subpart I of Part 98 · Table I-8 to Subpart I of Part 98—Default Emission Factors (1-UN2O,j) for N2O Utilization (UN2O,j)
- 40 CFR Table I-9 to Subpart I of Part 98 · Table I-9 to Subpart I of Part 98—Methods and Procedures for Conducting Emissions Test for Stack Systems