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- 40 CFR Table I-10 to Subpart I of Part 98 · Table I-10 to Subpart I of Part 98—Maximum Field Detection Limits Applicable to Fluorinated GHG Concentration Measurements for Stack Systems
- 40 CFR Table I-11 to Subpart I of Part 98 · Table I-11 to Subpart I of Part 98—Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for Semiconductor Manufacturing for Use With the Stack Test Method
- 40 CFR Table I-12 to Subpart I of Part 98 · Table I-12 to Subpart I of Part 98—Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for Semiconductor Manufacturing for Use With the Stack Test Method
- 40 CFR Table I-13 to Subpart I of Part 98 · Table I-13 to Subpart I of Part 98—Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for LCD Manufacturing for Use With the Stack Test Method
- 40 CFR Table I-14 to Subpart I of Part 98 · Table I-14 to Subpart I of Part 98—Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for PV Manufacturing for Use With the Stack Test Method
- 40 CFR Table I-15 to Subpart I of Part 98 · Table I-15 to Subpart I of Part 98—Default Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for MEMS Manufacturing for Use With the Stack Test Method
- 40 CFR Table I-16 to Subpart I of Part 98 · Table I-16 to Subpart I of Part 98—Default Emission Destruction or Removal Efficiency (DRE) Factors for Electronics Manufacturing
- 40 CFR Table I-17 to Subpart I of Part 98 · Table I-17 to Subpart I of Part 98—Expected and Possible By-Products for Electronics Manufacturing
- 40 CFR Table I-18 to Subpart I of Part 98 · Table I-18 to Subpart I of Part 98—Default Factors for Gamma (gi,p and gk,i,p) for Semiconductor Manufacturing and for MEMS and PV Manufacturing Under Certain Conditions * for Use With the Stack Testing Method
- 40 CFR Table I-19 to Subpart I of Part 98 · Table I-19 to Subpart I of Part 98—Reference Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for Semiconductor Manufacturing for 150 mm and 200 mm Wafer Sizes
- 40 CFR Table I-20 to Subpart I of Part 98 · Table I-20 to Subpart I of Part 98—Reference Emission Factors (1-Uij) for Gas Utilization Rates (Uij) and By-Product Formation Rates (Bijk) for Semiconductor Manufacturing for 300 mm Wafer Sizes
- 40 CFR Table I-21 to Subpart I of Part 98 · Table I-21 to Subpart I of Part 98—Examples of Fluorinated GHGs Used by the Electronics Industry
- 40 CFR Appendix A to Subpart I of Part 98 · Appendix A to Subpart I of Part 98—Alternative Procedures for Measuring Point-of-Use Abatement Device Destruction or Removal Efficiency
- 40 CFR 98.110 · Definition of the source category.
- 40 CFR 98.111 · Reporting threshold.
- 40 CFR 98.112 · GHGs to report.
- 40 CFR 98.113 · Calculating GHG emissions.
- 40 CFR 98.114 · Monitoring and QA/QC requirements.
- 40 CFR 98.115 · Procedures for estimating missing data.
- 40 CFR 98.116 · Data reporting requirements.
- 40 CFR 98.117 · Records that must be retained.
- 40 CFR 98.118 · Definitions.
- 40 CFR Table K-1 to Subpart K of Part 98 · Table K-1 to Subpart K of Part 98—Electric Arc Furnace (EAF) CH4 Emission Factors
- 40 CFR 98.120 · Definition of the source category.
- 40 CFR 98.121 · Reporting threshold.
- 40 CFR 98.122 · GHGs to report.
- 40 CFR 98.123 · Calculating GHG emissions.
- 40 CFR 98.124 · Monitoring and QA/QC requirements.
- 40 CFR 98.125 · Procedures for estimating missing data.
- 40 CFR 98.126 · Data reporting requirements.
- 40 CFR 98.127 · Records that must be retained.
- 40 CFR 98.128 · Definitions.
- 40 CFR Table L-1 to Subpart L of Part 98 · Table L-1 to Subpart L of Part 98—Ranges of Effective Destruction Efficiency
- 40 CFR Appendix A to Subpart L of Part 98 · Appendix A to Subpart L of Part 98—Mass Balance Method for Fluorinated Gas Production
- 40 CFR 98.140 · Definition of the source category.
- 40 CFR 98.141 · Reporting threshold.
- 40 CFR 98.142 · GHGs to report.
- 40 CFR 98.143 · Calculating GHG emissions.
- 40 CFR 98.144 · Monitoring and QA/QC requirements.
- 40 CFR 98.145 · Procedures for estimating missing data.
- 40 CFR 98.146 · Data reporting requirements.
- 40 CFR 98.147 · Records that must be retained.
- 40 CFR 98.148 · Definitions.
- 40 CFR Table N-1 to Subpart N of Part 98 · Table N-1 to Subpart N of Part 98—CO2 Emission Factors for Carbonate-Based Raw Materials
- 40 CFR 98.150 · Definition of the source category.
- 40 CFR 98.151 · Reporting threshold.
- 40 CFR 98.152 · GHGs to report.
- 40 CFR 98.153 · Calculating GHG emissions.
- 40 CFR 98.154 · Monitoring and QA/QC requirements.
- 40 CFR 98.155 · Procedures for estimating missing data.
- 40 CFR 98.156 · Data reporting requirements.
- 40 CFR 98.157 · Records that must be retained.
- 40 CFR 98.158 · Definitions.
- 40 CFR Table O-1 to Subpart O of Part 98 · Table O-1 to Subpart O of Part 98—Emission Factors for Equipment Leaks
- 40 CFR 98.160 · Definition of the source category.
- 40 CFR 98.161 · Reporting threshold.
- 40 CFR 98.162 · GHGs to report.
- 40 CFR 98.163 · Calculating GHG emissions.
- 40 CFR 98.164 · Monitoring and QA/QC requirements.
- 40 CFR 98.165 · Procedures for estimating missing data.
- 40 CFR 98.166 · Data reporting requirements.
- 40 CFR 98.167 · Records that must be retained.
- 40 CFR 98.168 · Definitions.
- 40 CFR 98.170 · Definition of the source category.
- 40 CFR 98.171 · Reporting threshold.
- 40 CFR 98.172 · GHGs to report.
- 40 CFR 98.173 · Calculating GHG emissions.
- 40 CFR 98.174 · Monitoring and QA/QC requirements.
- 40 CFR 98.175 · Procedures for estimating missing data.
- 40 CFR 98.176 · Data reporting requirements.
- 40 CFR 98.177 · Records that must be retained.
- 40 CFR 98.178 · Definitions.
- 40 CFR 98.180 · Definition of the source category.
- 40 CFR 98.181 · Reporting threshold.
- 40 CFR 98.182 · GHGs to report.
- 40 CFR 98.183 · Calculating GHG emissions.
- 40 CFR 98.184 · Monitoring and QA/QC requirements.
- 40 CFR 98.185 · Procedures for estimating missing data.
- 40 CFR 98.186 · Data reporting procedures.
- 40 CFR 98.187 · Records that must be retained.
- 40 CFR 98.188 · Definitions.
- 40 CFR 98.190 · Definition of the source category.
- 40 CFR 98.191 · Reporting threshold.
- 40 CFR 98.192 · GHGs to report.
- 40 CFR 98.193 · Calculating GHG emissions.
- 40 CFR 98.194 · Monitoring and QA/QC requirements.
- 40 CFR 98.195 · Procedures for estimating missing data.
- 40 CFR 98.196 · Data reporting requirements.
- 40 CFR 98.197 · Records that must be retained.
- 40 CFR 98.198 · Definitions.
- 40 CFR Table S-1 to Subpart S of Part 98 · Table S-1 to Subpart S of Part 98—Basic Parameters for the Calculation of Emission Factors for Lime Production
- 40 CFR 98.200 · Definition of source category.
- 40 CFR 98.201 · Reporting threshold.
- 40 CFR 98.202 · GHGs to report.
- 40 CFR 98.203 · Calculating GHG emissions.
- 40 CFR 98.204 · Monitoring and QA/QC requirements.
- 40 CFR 98.205 · Procedures for estimating missing data.
- 40 CFR 98.206 · Data reporting requirements.
- 40 CFR 98.207 · Records that must be retained.
- 40 CFR 98.208 · Definitions.